Differences

This shows you the differences between two versions of the page.

--- reports:start [2012/04/23 14:26] – janet
+++ reports:start [2020/03/06 09:04] (current) – external edit 127.0.0.1
@@ Line 19: / Line 19: @@
 |2008-8-21|Paul Newhouse|{{:reports:report_pn_wse2pbse_21aug08rev1.doc|Thin-film transport measurements of misfit layer compounds}}|resistivity, Seebeck, Hall|
+==== Thin-film Spectrometery  ====
+|^Date^Author^Title^Notes|
+|2006-xx-xx|Kilcher/McIntyre|{{:reports:index_calc_2006a_copy.xls|IndexCalc spreadsheet}}|Latest version of Levi's spreadsheet for thickness, refractive index and absorption calculation from Grating Spectrometer data |
+|2004-03-xx|Levi Kilcher|{{:reports:kilicher_ph403_fnl_pres.ppt.pdf|Grating spectrometer & index calculation}}|Senior thesis presentation on grating spectrometer|
+|2002-03-14|David McIntyre|{{:reports:thin_film_optics.ppt|Thin film optics}}|Fitting fringes to thin film R& T measurement|
 ==== Miscellaneous  ====
@@ Line 24: / Line 29: @@
 |2010-01-27|Dave Cohen, UO|{{:reports:dave_cohen_oregon_state_solar_cell_seminar_2010.pdf|Solar Cells}}|Great tutorial by one of the leader in the field.  OSU seminar|
 |2010-11-8|Daniel Harada|{{:reports:resistivity_and_seebeck_harada_2011.ppt|Resistivity}}|Resistivity measurement.  Based on earlier presentation by Robert Kykyneshi|
-|2002-03-14|David McIntyre|{{:reports:thin_film_optics.ppt|Thin film optics}}|Fitting fringes to thin film R& T measurement|
+=== Thermoelectric Reports ===
+|^Date^Author^Title^Notes|
+|2014-02-02|Rodney Snyder, Dan Speer| {{:reports:silicon_report.pdf|Silicon}} | Focus on the thermoelectric properties of doped silicon|

Trace:

Differences

Navigation

Search

Toolbox

QR Code