Quantitative Analysis Using X-ray
Diffraction
Abstract:
Powder x-ray diffraction was used to construct calibration curves of peak area versus for known amounts of impurities added to a possible solar cell material, Cu2ZnSnSe4, and from this a detection limit of each impurity was determined. The compounds which detection limits were determined are Cu2Se and SnSe and there detection limits were determined to be 19.2 mol% and 1.38 mol% ± 0.10 mol% respectively. The detection limit for Cu2Se may not be accurate due to the observed non-linearity.